The International Metrology Congress

The International Metrology Congress (CIM / Congrès International de Métrologie) Proceedings, hosted by EDP Sciences on behalf of the Collège Français de Métrologie (CFM), is a premier peer-reviewed scholarly repository dedicated to advanced measurement science, industrial applications, and legal metrology. Held biennially, the congress brings together research scientists, calibration specialists, industrial quality directors, and metrologists from national metrology institutes (NMIs) and international bodies (such as BIPM, OIML, and EURAMET) to address cutting-edge challenges in physical, chemical, and biological measurements. The digital repository provides full-text access to hundreds of research papers and technical proceedings covering fundamental unit realizations (SI units), measurement uncertainty estimation (GUM compliance), sensor calibration, smart factory instrumentation (Industry 4.0), carbon footprint verification, medical measurement reliability, and quantum metrology standards. By linking laboratory precision with real-world industrial, environmental, and healthcare applications, these proceedings serve as a crucial open educational resource. The repository delivers empirical research, peer-reviewed methodologies, and technical case studies for undergraduate and postgraduate students, mechanical and instrumentation engineers, quality control officers, and industrial physicists studying measurement systems, industrial quality management, calibration science, and experimental design.